In situ straining TEM analysis is a useful tool in materials science to investigate deformation mechanisms and stress induced transformations on the atomistic scale. Here we present a simple method for in situ straining experiments by using micro SMA actuators implemented in a TEM grid fabricated by thin film technology and sputter deposition of NiTi-based alloy compositions. Actuation during the experiment is performed by a slight temperature change (~40 K) of the grid which is either conducted by using a conventional heating holder or by local resistive heating. Depending on the microactuator design displacements of several 100 µm with forces up to 0.5 N can be achieved. Additionally a linear actuation movement with temperature change is observed which facilitates the strain control. To demonstrate the capability of this new concept first in situ straining TEM experiments for different materials like e.g. ZnO are presented.