Back to overview

Poster

Uncovering Planar Defects: Combined X-Ray Diffraction and Electron Microscopy to Study Elastic Coupling at Epitaxial Multiferroic Interfaces

Wednesday (07.06.2017)
20:21 - 20:24 Förde I
Part of:


The elastic coupling in multiferroic materials and even more so in magnetoelectric composites plays an important role for the properties and function of these materials. In this complementary in situ X-ray scattering experiment and transmission electron microscopy study we have investigated the crystal structure and its effect on the electrically induced strain transfer at the interface of a magnetoelectric composite. These planar composites consist of a piezoelectric 0.72Pb(Mn1/3Nb2/3)O3-0.28PbTiO3 substrate and an epitaxially grown magnetostrictive CoFe2O4 layer.

Grazing incidence X-ray diffraction experiments within an in situ applied electric field reveal a surprisingly non-perfect elastic coupling of the in plane strain ε[100] of 87%±7% in this epitaxial system. High-resolution transmission electron microscopy micrographs explain this behavior by the presence of planar defects in the CoFe2O4 film acting as trapping sites for a complete strain transfer.

 

Speaker:
Niklas Wolff
Christian-Albrechts-University of Kiel
Additional Authors:
  • Dr. Christian T. Koops
    Kiel University
  • Dr. Medjid Abes
    Kiel University
  • Dr. Stjepan B. Hrkac
    Kiel University
  • Dr. Joachim Stettner
    Kiel University
  • Philipp Jordt
    Kiel University
  • Dr. Adrian Petraru
    Kiel University
  • Prof. Dr. Hermann Kohlstedt
    Kiel University
  • Dr. Viktor Hrkac
    Kiel University
  • Prof. Dr. Lorenz Kienle
    Kiel University
  • Dr. Oliver H. Seeck
    Deutsches Elektronen Synchrotron DESY
  • Dr. Gareth Nisbet
    Harwell Science and Innovation Campus
  • Prof. Dr. Olaf M. Magnussen
    Kiel University
  • Dr. Bridget. M. Murpyh
    Kiel University